About this scholarly article

2001 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC (Cat. No.01CH37177) - Backside infrared probing for static voltage drop and dynamic timing measurements by Rusu, S.; Seidel, S.; Woods, G.; Grannes, D.; Muljono, H.; Rowlette, J.; Petrosky, K. is a scholarly article available to read on EtoBox.

Author

Rusu, S.; Seidel, S.; Woods, G.; Grannes, D.; Muljono, H.; Rowlette, J.; Petrosky, K.

Publisher

IEEE

Published

2001

Language

EN