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About this Engineering article
Improving TID Radiation Robustness of a CMOS OxRAM-Based Neuron Circuit by Using Enclosed Layout Transistors by Pablo Ilha Vaz; Patrick Girard; Arnaud Virazel; Hassen Aziza is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Pablo Ilha Vaz; Patrick Girard; Arnaud Virazel; Hassen Aziza
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Published
- 2021
- Language
- EN
- Field
- Engineering (Physical Sciences)
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