About this scholarly article

2011 IEEE International Test Conference - Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks by Zhang, Zhaobo; Chakrabarty, Krishnendu; Wang, Zhanglei; Wang, Zhiyuan; Gu, Xinli is a scholarly article available to read on EtoBox.

Author

Zhang, Zhaobo; Chakrabarty, Krishnendu; Wang, Zhanglei; Wang, Zhiyuan; Gu, Xinli

Publisher

IEEE

Published

2011

Language

EN