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About this Engineering article
SOI FinFET nFET-to-pFET Tracking Variability Compact Modeling and Impact on Latch Timing by Deng, Jie; Rahman, Ardasheir; Thoma, Rainer; Schneider, Peter W.; Johnson, Jim; Trombley, Henry; Lu, Ning; Williams, Richard Q.; Nayfeh, Hasan M.; Zhao, Kai; Robison, Russ; Guan, Ximeng; Zamdmer, Noah; Shuma, Steve; Worth, Brian; Sundquist, James E.; Foreman, Eric A.; Springer, Scott K.; Wachnik, Rick is a Engineering article available to read on EtoBox.
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- Author
- Deng, Jie; Rahman, Ardasheir; Thoma, Rainer; Schneider, Peter W.; Johnson, Jim; Trombley, Henry; Lu, Ning; Williams, Richard Q.; Nayfeh, Hasan M.; Zhao, Kai; Robison, Russ; Guan, Ximeng; Zamdmer, Noah; Shuma, Steve; Worth, Brian; Sundquist, James E.; Foreman, Eric A.; Springer, Scott K.; Wachnik, Rick
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 2015
- Language
- EN
- Field
- Engineering (Physical Sciences)