About this scholarly article

2014 IEEE International Conference on Electron Devices and Solid-State Circuits - Reliability and instabilities in GaN-based HEMTs by Meneghesso, Gaudenzio; Meneghini, Matteo; Zanoni, Enrico is a scholarly article available to read on EtoBox.

Author

Meneghesso, Gaudenzio; Meneghini, Matteo; Zanoni, Enrico

Publisher

IEEE

Published

2014

Language

EN