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About this Engineering article
Thickness Dependence of Proton Conductivity of Amorphous Aluminosilicate Nanofilm by Aoki, Yoshitaka; Habazaki, H.; Kunitake, Toyoki is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Aoki, Yoshitaka; Habazaki, H.; Kunitake, Toyoki
- Publisher
- The Electrochemical Society; Electrochemical Society, Inc. (ISSN 1099-0062)
- Published
- 2008
- Language
- EN
- Field
- Engineering (Physical Sciences)
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