About this scholarly article

2012 15th International Power Electronics and Motion Control Conference (EPE/PEMC) - Transient analysis and simulation of a high power IGBT non-destructive tester by Ahmed, A.; Coulbeck, L.; Castellazzi, A.; Johnson, C. M. is a scholarly article available to read on EtoBox.

Author

Ahmed, A.; Coulbeck, L.; Castellazzi, A.; Johnson, C. M.

Publisher

IEEE

Published

2012

Language

EN