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About this Physics and Astronomy article

Effect of Analysis Direction on the Measurement of Interfacial Mixing in Thin Metal Layers with Atom Probe Tomography by D.J. Larson; T.J. Prosa; B.P. Geiser; W.F. Egelhoff Jr. is a Physics and Astronomy article available to read on EtoBox.

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Author
D.J. Larson; T.J. Prosa; B.P. Geiser; W.F. Egelhoff Jr.
Publisher
Elsevier Science; Elsevier ; Elsevier BV (ISSN 0304-3991)
Published
2011
Language
EN
Field
Physics and Astronomy (Physical Sciences)

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