Opening book details…
About this Materials Science article
High resolution electron microscopy study of electronic energy loss effects in thallium-based superconducting copper oxides irradiated by 5.8 GeV-Xe ions† by Hardy, V.; Hervieu, M.; Groult, D.; Provost, J. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Hardy, V.; Hervieu, M.; Groult, D.; Provost, J.
- Publisher
- Taylor and Francis Group; Informa UK (Taylor & Francis); Taylor & Francis; Informa UK Limited (ISSN 1042-0150)
- Published
- 1991
- Field
- Materials Science (Physical Sciences)
More by Hardy, V.; Hervieu, M.; Groult, D.; Provost, J.
Browse all works by Hardy, V.; Hervieu, M.; Groult, D.; Provost, J.