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About this Engineering article
Using Bayesian networks to improve fault diagnosis during manufacturing tests of mobile telephone infrastructure by Chan, A; McNaught, K R is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chan, A; McNaught, K R
- Publisher
- Palgrave Publishers Ltd.; Informa UK (Taylor & Francis); Taylor & Francis; Springer Science and Business Media LLC; Informa UK Limited; JSTOR (ISSN 0160-5682)
- Published
- 2008
- Language
- EN
- Field
- Engineering (Social Sciences)