About this scholarly article

SPIE Proceedings [SPIE Optical Data Storage 2003 - Vancouver, Canada (Sunday 11 May 2003)] Optical Data Storage 2003 - New test stand for dynamically testing coupon samples by Zhang, Yan; O'Neill, Michael; Miyagawa, Naoyasu; Milster, Thomas D.; Butz, John; Bletscher, Warren L. is a scholarly article available to read on EtoBox.

Author

Zhang, Yan; O'Neill, Michael; Miyagawa, Naoyasu; Milster, Thomas D.; Butz, John; Bletscher, Warren L.

Publisher

SPIE

Published

2003

Language

EN