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About this Engineering article
Physical Insights into Vacancy-Based Memtransistors: Toward Power Efficiency, Reliable Operation, and Scalability by Sivan, Maheswari (author);Leong, Jin Feng (author);Ghosh, Joydeep (author);Tang, Baoshan (author);Pan, Jieming (author);Zamburg, Evgeny (author);Thean, Aaron Voon-Yew (author) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Sivan, Maheswari (author);Leong, Jin Feng (author);Ghosh, Joydeep (author);Tang, Baoshan (author);Pan, Jieming (author);Zamburg, Evgeny (author);Thean, Aaron Voon-Yew (author)
- Publisher
- American Chemical Society (ACS)
- Published
- 2022
- Field
- Engineering (Physical Sciences)