About this scholarly article

Proceedings. International Test Conference - Fault tuples in diagnosis of deep-submicron circuits by Blanton, R.D.; Chen, J.T.; Desineni, R.; Dwarakanath, K.N.; Maly, W.; Vogels, T.J. is a scholarly article available to read on EtoBox.

Author

Blanton, R.D.; Chen, J.T.; Desineni, R.; Dwarakanath, K.N.; Maly, W.; Vogels, T.J.

Publisher

IEEE

Published

2002

Language

EN