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The presentation discusses the need for reliable qualification methods for emerging semiconductor power devices, particularly focusing on hard-switching conditions that are not adequately covered by existing JEDEC standards. It emphasizes the importance of using a double-pulse tester as a compliant test vehicle to assess device performance under real-world conditions and to identify potential failure modes. The goal is to enhance customer confidence in the reliability of these technologies, facilitating the
- Author
- luciano.sdbezerra
- Language
- EN