About this scholarly article

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Advanced Telescope Design, Fabrication, and Control - Acceptance tests of the INTEGRAL Optical Monitoring Camera subsystems by Mazy, Emmanuel; Plesseria, J.-Y.; Renotte, Etienne; Rochus, Pierre P.; Roybal, William is a scholarly article available to read on EtoBox.

Author

Mazy, Emmanuel; Plesseria, J.-Y.; Renotte, Etienne; Rochus, Pierre P.; Roybal, William

Publisher

SPIE

Published

1999

Language

EN