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About this Engineering article
Voltage Scaling for SRAM in 45nm CMOS Process by Hu, Jian Ping; Zhu, Jia Guo is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Hu, Jian Ping; Zhu, Jia Guo
- Publisher
- Trans Tech Publications Inc.; Trans Tech Publications, Ltd.; Scitec Publications Ltd. (ISSN 1660-9336)
- Published
- 2010
- Field
- Engineering (Physical Sciences)