About this scholarly article

2015 15th International Superconductive Electronics Conference (ISEC) - Defects of Nb/AlOx/Nb Josephson Junctions Caused by Underneath Fine Particles by Hidaka, Mutsuo; Nagasawa, Shuichi; Satoh, Tetsuro; Hinode, Kenji is a scholarly article available to read on EtoBox.

Author

Hidaka, Mutsuo; Nagasawa, Shuichi; Satoh, Tetsuro; Hinode, Kenji

Publisher

IEEE

Published

2015

Language

EN