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Soft Error Reliability of VLSI Circuits : Analysis and Mitigation Techniques by Behnam Ghavami, Mohsen Raji is a nonfiction available to read on EtoBox.

What is Soft Error Reliability of VLSI Circuits : Analysis and Mitigation Techniques about?

This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today's reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques. Provides an accessible, comprehensive introduction to

Who reads Soft Error Reliability of VLSI Circuits : Analysis and Mitigation Techniques?

Author

Behnam Ghavami, Mohsen Raji

Publisher

Springer International Publishing : Imprint: Springer

Published

2021

Language

EN

ISBN

9783030516093

Category

nonfiction

Subjects

Engineering, Computer Science, Technology