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About this Engineering article
Application of Machine Learning Techniques for Amplitude and Phase Noise Characterization by Zibar, Darko; de Carvalho, Luis Henrique Hecker; Piels, Molly; Doberstein, Andy; Diniz, Julio; Nebendahl, Bernd; Franciscangelis, Carolina; Estaran, Jose; Haisch, Hansjoerg; Gonzalez, Neil G.; de Oliveira, Julio Cesar R. F.; Monroy, Idelfonso Tafur is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Zibar, Darko; de Carvalho, Luis Henrique Hecker; Piels, Molly; Doberstein, Andy; Diniz, Julio; Nebendahl, Bernd; Franciscangelis, Carolina; Estaran, Jose; Haisch, Hansjoerg; Gonzalez, Neil G.; de Oliveira, Julio Cesar R. F.; Monroy, Idelfonso Tafur
- Publisher
- Optical Society of America; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0733-8724)
- Published
- 2015
- Language
- EN
- Field
- Engineering (Physical Sciences)