About this Materials Science article
Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis by Lutterotti, Luca; Vasin, Roman; Wenk, Hans-Rudolf is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Lutterotti, Luca; Vasin, Roman; Wenk, Hans-Rudolf
- Publisher
- International Centre for Diffraction Data; Cambridge University Press; Cambridge University Press (CUP) (ISSN 0885-7156)
- Published
- 2014
- Language
- EN
- Field
- Materials Science (Physical Sciences)