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About this Engineering article
Deep trap measurement on S+-implanted layers in GaAs by Yokoyama, N.; Ohkawa, S.; Sakurai, T.; Furuya, T.; Ishikawa, H. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Yokoyama, N.; Ohkawa, S.; Sakurai, T.; Furuya, T.; Ishikawa, H.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 1976
- Language
- EN
- Field
- Engineering (Physical Sciences)
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