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Can I read Influence of depth resolution on the interdiffusion data in thin film bilayer and multilayer Ag/Pd structures on EtoBox?
Influence of depth resolution on the interdiffusion data in thin film bilayer and multilayer Ag/Pd structures by A Bukaluk is a Engineering article available to read on EtoBox.
What is Influence of depth resolution on the interdiffusion data in thin film bilayer and multilayer Ag/Pd structures about?
This paper reports results of the interdi!usion studies in thin "lm Ag/Pd bilayer and multilayer structures, deposited onto the SiO and Cu substrates. Interdi!usion coe$cients have been obtained from the changes of slopes of depth pro"les at the interface of the two layers, from the rate of rise of di!usant concentration in the plateau region of the pro"le and from the change of the concentration distribution in the Ag/Pd multilayer structure. In all cases the depth resolution has been determined and its in#uence on the interdi!usion data has been studied. The values of the activation energy and the pre-exponential di!usivity term in the Arrhenius equation have been extrapolated to zero depth.
Who reads Influence of depth resolution on the interdiffusion data in thin film bilayer and multilayer Ag/Pd structures?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- A Bukaluk
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0042-207X)
- Published
- 2001
- Language
- EN
- Field
- Engineering (Physical Sciences)