About this scholarly article

SPIE Proceedings [SPIE SPIE Defense and Security Symposium - Orlando, FL (Sunday 16 March 2008)] Polarization: Measurement, Analysis, and Remote Sensing VIII - Micro-scale surface and contaminate modeling for polarimetric signature prediction by Gartley, M. G.; Chenault, David B.; Goldstein, Dennis H.; Brown, S. D.; Schott, J. R. is a scholarly article available to read on EtoBox.

Author

Gartley, M. G.; Chenault, David B.; Goldstein, Dennis H.; Brown, S. D.; Schott, J. R.

Publisher

SPIE

Published

2008