About this scholarly article

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Raman Spectroscopy and Light Scattering Technologies in Materials Science - Demonstration of a high-precision optical probe for effective sampling of solids by Raman spectroscopy by Marquardt, Brian J.; Le, Thao; Burgess, Lloyd W.; Andrews, David L. is a scholarly article available to read on EtoBox.

Author

Marquardt, Brian J.; Le, Thao; Burgess, Lloyd W.; Andrews, David L.

Publisher

SPIE

Published

2001