About this scholarly article

ECS Transactions [AAPM 25th Symposium on Microelectronics Technology and Devices - Sao Paulo, Brazil (September 6 - September 9, 2010)] - A New Correlation-Based Granulometry Algorithm with Application in Characterizing Porous Silicon Nanomaterials by Maruta, Ricardo H.; Kim, Hae Yong; Huanca, Danilo R.; Salcedo, Walter J.; Pavanello, M.; Claeys, C.; Martino, J. is a scholarly article available to read on EtoBox.

Author

Maruta, Ricardo H.; Kim, Hae Yong; Huanca, Danilo R.; Salcedo, Walter J.; Pavanello, M.; Claeys, C.; Martino, J.

Publisher

AAPM

Published

2010

Language

EN