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About this Engineering article
AC Variability and Endurance Measurement Technique for Resistive Switching Memories by Deora, S.; Bersuker, G.; Matthews, K.; Gilmer, D. C.; Kirsch, P. D. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Deora, S.; Bersuker, G.; Matthews, K.; Gilmer, D. C.; Kirsch, P. D.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1530-4388)
- Published
- 2014
- Field
- Engineering (Physical Sciences)
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