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About this Computer Science article
Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate by Arai, Masayuki (author);Fukumoto, Satoshi (author);Iwasaki, Kazuhiko (author);Matsuo, Tatsuru (author);Hiraide, Takahisa (author);Konishi, Hideaki (author);Emori, Michiaki (author);Aikyo, Takashi (author) is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- Arai, Masayuki (author);Fukumoto, Satoshi (author);Iwasaki, Kazuhiko (author);Matsuo, Tatsuru (author);Hiraide, Takahisa (author);Konishi, Hideaki (author);Emori, Michiaki (author);Aikyo, Takashi (author)
- Publisher
- Institute of Electronics, Information and Communications Engineers (IEICE)
- Published
- 2008
- Field
- Computer Science (Physical Sciences)