Opening book details…
About this Physics and Astronomy article
Spectroscopic ellipsometry: A new tool for nondestructive depth profiling and characterization of interfaces by McMarr, P. J.; Vedam, K.; Narayan, J. is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- McMarr, P. J.; Vedam, K.; Narayan, J.
- Publisher
- American Institute of Physics; AIP Publishing; Publons (ISSN 0021-8979)
- Published
- 1986
- Field
- Physics and Astronomy (Physical Sciences)