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An Introduction to Cluster Secondary Ion Mass Spectrometry (Cluster SIMS) by Mahoney, Christine M. is a scholarly article available to read on EtoBox.

What is An Introduction to Cluster Secondary Ion Mass Spectrometry (Cluster SIMS) about?

Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on org

Author

Mahoney, Christine M.

Publisher

John Wiley & Sons, Incorporated

Published

2013

Language

EN

ISBN

9781118589250