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About this Materials Science article
X-ray diffraction micro-imaging of strain in laterally overgrown GaAs layers. Part I: analysis of a single GaAs stripe by A. Czyzak; J.Z. Domagala; G. Maciejewski; Z.R. Zytkiewicz is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- A. Czyzak; J.Z. Domagala; G. Maciejewski; Z.R. Zytkiewicz
- Publisher
- Springer; Springer-Verlag; Springer Verlag; Springer Science and Business Media LLC (ISSN 1432-0630)
- Published
- 2008
- Language
- EN
- Field
- Materials Science (Physical Sciences)