About this scholarly article

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 25 June 2017)] Optical Measurement Systems for Industrial Inspection X - Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing by Lehmann, Peter; Osten, Wolfgang; Albertazzi Gonçalves, Armando; Zheng, Dongliang; Kemao, Qian; Da, Feipeng; Seah, Hock Soon is a scholarly article available to read on EtoBox.

Author

Lehmann, Peter; Osten, Wolfgang; Albertazzi Gonçalves, Armando; Zheng, Dongliang; Kemao, Qian; Da, Feipeng; Seah, Hock Soon

Publisher

SPIE

Published

2017

Language

EN