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About this Engineering article
Study of fatigue failure in Al-chip-metallization during power cycling by Durand, C.; Klingler, M.; Coutellier, D.; Naceur, H. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Durand, C.; Klingler, M.; Coutellier, D.; Naceur, H.
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0013-7944)
- Published
- 2015
- Language
- EN
- Field
- Engineering (Physical Sciences)