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Fast X‐ray Nanotomography with Sub‐10 nm Resolution as a Powerful Imaging Tool for Nanotechnology and Energy Storage Applications by Vincent De Andrade; Viktor Nikitin; Michael Wojcik; Alex Deriy; Sunil Bean; Deming Shu; Tim Mooney; Kevin Peterson; Prabhat Kc; Kenan Li; Sajid Ali; Kamel Fezzaa; Doga Gürsoy; Cassandra Arico; Saliha Ouendi; David Troadec; Patrice Simon; Francesco De Carlo; Christophe Lethien is a Engineering article available to read on EtoBox.
What is Fast X‐ray Nanotomography with Sub‐10 nm Resolution as a Powerful Imaging Tool for Nanotechnology and Energy Storage Applications about?
nano-computed-tomography (nano-CT). They have emerged in many synchrotrons worldwide [1][2][3][4][5][6] and have been widely used in energy science where typical spatial resolutions of 30-60 nm and respective field of view (FOV) of about 40-70 μm are ideal for the ex situ or in situ characterization of different type of lithium-ion batteries. [7][8][9][10][11][12] However, they can be also utilized to characterize any type of materials like alloys, [13,14] rocks, [15] single minerals in solution, [16,17] polymers, [18] liquids, [19] biological tissues, [20] etc. While 19 nm spatial resolution has been reported in 2D on gold test patterns with long exposure, [21,22] existing TXMs operating with high brightness synchrotron sources currently provide a maximum resolution of 30 nm. [23] Projection microscopy, another full-field nano-CT technique, has the potential of achieving sub-20 nm spatial resolution. However, the best 3D resolution reported so far is 55 nm. [24] The constant and rapid development of manufactured nanomaterials and the societal and economic stakes associated with them are important drivers for improving the resolving power of X-ray microscopes. In the last decade, t
Who reads Fast X‐ray Nanotomography with Sub‐10 nm Resolution as a Powerful Imaging Tool for Nanotechnology and Energy Storage Applications?
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Vincent De Andrade; Viktor Nikitin; Michael Wojcik; Alex Deriy; Sunil Bean; Deming Shu; Tim Mooney; Kevin Peterson; Prabhat Kc; Kenan Li; Sajid Ali; Kamel Fezzaa; Doga Gürsoy; Cassandra Arico; Saliha Ouendi; David Troadec; Patrice Simon; Francesco De Carlo; Christophe Lethien
- Publisher
- Wiley
- Published
- 2021
- Language
- EN
- Field
- Engineering (Physical Sciences)