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About this Engineering article
Microstructural Investigation of SexTe100-x Thin Films Deposited on Si(100) Substrates by X-ray Diffractometer and Transmission Electron Microscopy Analysis by Kim, Eun Tae; Lee, Jeong Yong; Kim, Yong Tae is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kim, Eun Tae; Lee, Jeong Yong; Kim, Yong Tae
- Publisher
- Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
- Published
- 2007
- Field
- Engineering (Physical Sciences)
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