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About this Materials Science article
A developed full-field fem analysis combined with ESPI for the investigation of defect evolution in polymer films by Liu, Xiao-fang; Tan, Shuai-xia; Zhang, Xiao-li; Zhao, Ning; Xu, Jian is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Liu, Xiao-fang; Tan, Shuai-xia; Zhang, Xiao-li; Zhao, Ning; Xu, Jian
- Publisher
- Institute of Chemistry Chinese Academy of Sciences; Springer-Verlag; Springer Verlag; Springer Science and Business Media LLC (ISSN 0256-7679)
- Published
- 2013
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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