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About this Engineering article
A Regularized Phenomenological Multiscale Damage Model by Liu, Yang; Filonova, Vasilina; Hu, Nan; Yuan, Zifeng; Fish, Jacob; Yuan, Zheng; Belytschko, Ted is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Liu, Yang; Filonova, Vasilina; Hu, Nan; Yuan, Zifeng; Fish, Jacob; Yuan, Zheng; Belytschko, Ted
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); John Wiley & Sons Inc.; Wiley (ISSN 0029-5981)
- Published
- 2014
- Language
- EN
- Field
- Engineering (Physical Sciences)