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About this Materials Science article
Growth, Morphological and Structural Characterization of Silicon Carbide Epilayers for Power Electronic Devices Applications by C. F. Pirri; S. Porro; S. Ferrero; E. Celasco; S. Guastella; L. Scaltrito; R. Yakimova; M. Syväjärvi; R. R. Ciechonski; S. De Angelis; D. Crippa is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- C. F. Pirri; S. Porro; S. Ferrero; E. Celasco; S. Guastella; L. Scaltrito; R. Yakimova; M. Syväjärvi; R. R. Ciechonski; S. De Angelis; D. Crippa
- Publisher
- John Wiley and Sons; Wiley (John Wiley & Sons); Wiley - V C H Verlag GmbbH & Co.; Wiley (ISSN 0232-1300)
- Published
- 2005
- Field
- Materials Science (Physical Sciences)