About this Engineering article
Laser Scanning Confocal Thermoreflectance Microscope for the Backside Thermal Imaging of Microelectronic Devices by Kim, Dong; Jeong, Chan; Kim, Jung; Lee, Kye-Sung; Hur, Hwan; Nam, Ki-Hwan; Kim, Geon; Chang, Ki is a Engineering article available to read on EtoBox.
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- Author
- Kim, Dong; Jeong, Chan; Kim, Jung; Lee, Kye-Sung; Hur, Hwan; Nam, Ki-Hwan; Kim, Geon; Chang, Ki
- Publisher
- Molecular Diversity Preservation International; MDPI AG; Multidisciplinary Digital Publishing Institute (MDPI); Basel: Molecular Diversity Preservation International (MDPI), 2001-; Publons (ISSN 1424-8220)
- Published
- 2017
- Field
- Engineering (Physical Sciences)