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About this Physics and Astronomy article
Single particle transient response and displacement damage in CMOS image sensors induced by high energy neutrons at Back-n in CSNS facility by Wang, Zujun; Xue, Yuanyuan; Chen, Wei; Ning, Hao; Xu, Rui; Guo, Xiaoqiang; Sheng, Jiangkun; Yao, Zhibin; He, Baoping; Ma, Wuying; Dong, Guantao is a Physics and Astronomy article available to read on EtoBox.
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- Author
- Wang, Zujun; Xue, Yuanyuan; Chen, Wei; Ning, Hao; Xu, Rui; Guo, Xiaoqiang; Sheng, Jiangkun; Yao, Zhibin; He, Baoping; Ma, Wuying; Dong, Guantao
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV; ScienceOpen (ISSN 0168-9002)
- Published
- 2019
- Language
- EN
- Field
- Physics and Astronomy (Physical Sciences)