About this scholarly article

SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, California (Sunday 17 January 2010)] Sensors, Cameras, and Systems for Industrial/Scientific Applications XI - Photon counting with an EMCCD by Daigle, Olivier; Blais-Ouellette, Sébastien; Bodegom, Erik; Nguyen, Valérie is a scholarly article available to read on EtoBox.

Author

Daigle, Olivier; Blais-Ouellette, Sébastien; Bodegom, Erik; Nguyen, Valérie

Publisher

SPIE

Published

2010

Language

EN