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About this Engineering article
Polarity and threading dislocation dependence of the surface morphology of c-GaN films exposed to HCl vapor by Lee, Hyunkyu; Jang, Dongsoo; Kim, Donghoi; Kim, Hwa Seob; Kim, Chinkyo is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Lee, Hyunkyu; Jang, Dongsoo; Kim, Donghoi; Kim, Hwa Seob; Kim, Chinkyo
- Publisher
- The Royal Society of Chemistry; Royal Society of Chemistry; Royal Society of Chemistry (RSC) (ISSN 2050-7526)
- Published
- 2018
- Field
- Engineering (Physical Sciences)