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About this Engineering article
Data-driven Feature Extraction for Analog Circuit Fault Diagnosis Using 1-D Convolutional Neural Network by Yang, Huahui; Meng, Chen; Wang, Cheng is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Yang, Huahui; Meng, Chen; Wang, Cheng
- Publisher
- Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers Inc.; Institute of Electrical and Electronics Engineers (IEEE); Research Square (ISSN 2169-3536)
- Published
- 2020
- Field
- Engineering (Physical Sciences)