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IEEE International Integrated Reliability Workshop Final Report, 2003 - Effect of nitrogen incorporation on PMOS negative bias temperature instability in ultrathin oxi-nitrides by Duong, L.; Li, E.; Gopinath, V.; Prasad, S.; Lin, J.; Pachura, D.; Hornback, V. is a scholarly article available to read on EtoBox.
- Author
- Duong, L.; Li, E.; Gopinath, V.; Prasad, S.; Lin, J.; Pachura, D.; Hornback, V.
- Publisher
- IEEE
- Published
- 2003
- Language
- EN
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