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About this Materials Science article
Application of IR ellipsometry to determination of the film thickness of a polytetrafluoroethylene sample modified in direct-current discharge by M. O. Makeev; Yu. A. Ivanov; S. A. Meshkov; A. B. Gil’man; M. Yu. Yablokov is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- M. O. Makeev; Yu. A. Ivanov; S. A. Meshkov; A. B. Gil’man; M. Yu. Yablokov
- Publisher
- SP MAIK Nauka/Interperiodica; Pleiades Publishing; Springer Science and Business Media LLC; Pleiades Publishing Ltd (ISSN 0018-1439)
- Published
- 2011
- Language
- EN
- ISBN
- 9780018143913
- Field
- Materials Science (Physical Sciences)
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