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About this Materials Science article
Aging-time-resolved in situ microstructural investigation of tin films electroplated on copper substrates, applying two-dimensional-detector X-ray diffraction by Stein, Jendrik; Welzel, Udo; Huegel, Werner; Blatt, Sabine; Mittemeijer, Eric Jan is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Stein, Jendrik; Welzel, Udo; Huegel, Werner; Blatt, Sabine; Mittemeijer, Eric Jan
- Publisher
- International Union of Crystallography; Blackwell Publishing Inc.; International Union of Crystallography (IUCr) (ISSN 0021-8898)
- Published
- 2013
- Language
- EN
- ISBN
- 9780021889815
- Field
- Materials Science (Physical Sciences)