About this scholarly article

SPIE Proceedings [SPIE San Diego - DL tentative - San Diego, CA (Monday 1 July 1991)] Advanced Optical Manufacturing and Testing II - Spatial frequency response for an optical profiler by Auriemma, R. A.; Bietry, Joseph; Bristow, Thomas C.; Wagner, Gary; Doherty, Victor J. is a scholarly article available to read on EtoBox.

Author

Auriemma, R. A.; Bietry, Joseph; Bristow, Thomas C.; Wagner, Gary; Doherty, Victor J.

Publisher

SPIE

Published

1992