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About this Computer Science article
Integrating Pattern Matching and Abstract Interpretation for Verifying Cautions of Microcontrollers by Nguyen, Thuy (author);Tomita, Takashi (author);Endo, Junpei (author);Aoki, Toshiaki (author) is a Computer Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- Nguyen, Thuy (author);Tomita, Takashi (author);Endo, Junpei (author);Aoki, Toshiaki (author)
- Publisher
- Wiley
- Published
- 2021
- Field
- Computer Science (Physical Sciences)