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What is FinFET Leakage Estimation Method about?

This paper presents a statistical method for estimating leakage current in FinFET devices that accounts for their width quantization property. Conventional methods underestimate leakage by up to 43% by ignoring this property. The proposed method models the threshold voltage of multiple fins using an "effective" threshold voltage with a mean and standard deviation calculated from the number of fins. Monte Carlo simulations show the proposed method estimates leakage within 5% error, improving on conventional

Author

Kumar Puspesh

Language

EN