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Thermally induced failure mechanisms of organic light emitting device structures probed by X-ray specular reflectivity by P. Fenter; F. Schreiber; V. Bulović; S.R. Forrest is a Physics and Astronomy article available to read on EtoBox.

What is Thermally induced failure mechanisms of organic light emitting device structures probed by X-ray specular reflectivity about?

The thermal evolution of organic light emitting device structures and materials has been measured using X-ray specular reflectivity. Thermally induced failure of these structures is found to be due to the large thermal expansion of the hole transport layer (N,N'-diphenyl-N,N'-bis(3-methylphenyl)l,l'-biphenyl-4,4'diamine, or TPD) associated with its low glass transition temperature, suggesting a strain-driven failure mechanism (as opposed to TPD recrystallization). These results suggest the possibility of optimizing organic light emitting devices through direct in-situ measurements of their structure and stability.

Who reads Thermally induced failure mechanisms of organic light emitting device structures probed by X-ray specular reflectivity?

Author

P. Fenter; F. Schreiber; V. Bulović; S.R. Forrest

Publisher

Elsevier Science; Elsevier ; Elsevier BV (ISSN 0009-2614)

Published

1997

Language

EN

Field

Physics and Astronomy (Physical Sciences)