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About this book
Inelastic mean-free path and mean escape depth of 10–140 eV electrons in SiO2 nanoparticles determined by Si 2p photoelectron yields by E. Antonsson & F. Gerke & B. Langer & C. Goroncy & T. Dresch & T. Leisner & C. Graf & E. R & #xFC;hl is a book available to read on EtoBox.
- Author
- E. Antonsson & F. Gerke & B. Langer & C. Goroncy & T. Dresch & T. Leisner & C. Graf & E. R & #xFC;hl
- Publisher
- Royal Society of Chemistry
- Language
- EN
More by E. Antonsson & F. Gerke & B. Langer & C. Goroncy & T. Dresch & T. Leisner & C. Graf & E. R & #xFC;hl
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